(日本語) 2025年ネプコンジャパン　出展 | Insight k.k.

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HOMENEWS(日本語) 2025年ネプコンジャパン　出展

(日本語) 2025年ネプコンジャパン　出展

NEWS

Corporate philosophy
About us
Our business
Applications

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Products

Phased array ultrasound analysis
SOCOSWIFT-PA
FAAST-PA Socomate
SOCOSCAN-PA

Non-destructive testing simulation
CIVA-UT – Ultrasound Simulation
CIVA-EC – Eddy Current Simulation
CIVA-RX – X-ray Simulation
CIVA-GWT Guided wave flaw simulation made by CEA

Ultrasonic Pulser/Receiver
RPR-4000 High Power Sin-Wave Pulser/Receiver
SP801A Square Wave Pulser
DPR300 Spike Pulser
GA 2500A Gated Amplifier
BR640A Wide Band Receiver
RAM5000 Ritec Advanced Measurement System
DPR500 Spike Pulser
PureView

Ultrasound imaging
IS-202 Desktop Scanner
IS-350 Standard Scanner
FlexScan Multi-Axis Scanner

Laser ultrasound
TWM Laser ultrasonic receiver
PDL Pulsed Detection Laser
LUS Laser Ultrasonic System
(日本語) レーザー超音波リアルタイム金属微細構造解析ツール　Lumet

Evaluation of physical properties by ultrasound
SNAP
IDMS-200 RUS Resonance Ultrasound Spectoroscopy

Coating thickness measurement
uPELT-ts
Robotic PELT

Transducers
Ultrasound Transducer / Immersion
EMAT
Pinducer
Ultrasound Transducer / Contact

multiple channel corresponding ultrasonic flaw detector
SOCO-(4 to 8) P-UT
SOCO-8S-UT

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